DRAM Testing Approach

Full ATEs

Industry Standard

High Initial Cost, High Maintenance

Need Application Testing to compliment the entire process

FPGA Based Tester

Low Cost

Simple to Start

Easy to Use

Partial ATE functions,

Poor in Application Correlations

By Applications, e.g., PC Motherboard

Application Specific >> Preferably for highly targeted Testing

Lack of Algorithmic, margin, temperature … controls

SyncMAX adopts 3 in 1 Approach

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